Description
Memory corruption while handling test pattern generator IOCTL command.
Affected products
| Vendor | Product | Affected | Fixed |
|---|---|---|---|
| Qualcomm | Snapdragon | SDM429W, Snapdragon 429 Mobile Platform, WCN3620, WCN3660B | — |
Medium · 6.6
CVE-2024-53017
EUVD-2024-54636GHSA-gg54-6w37-7r4j
Use of Out-of-range Pointer Offset in Camera Driver
Published Jun 3, 2025 · Updated Jun 3, 2025 · Assigned by qualcomm