Description
Memory corruption occurs when handling client calls to EnableTestMode through an Escape call.
Affected products
| Vendor | Product | Affected | Fixed |
|---|---|---|---|
| Qualcomm | Snapdragon | AQT1000, FastConnect 6200, FastConnect 6700, FastConnect 6800, FastConnect 6900, FastConnect 7800, QCA6391, QCA6420, QCA6430, QCM5430, QCM6490, QCS5430, QCS6490, Qualcomm Video Collaboration VC3 Platform, SC8180X+SDX55, SC8380XP, SM6250, Snapdragon 7c Compute Platform (SC7180-AC), Snapdragon 7c Gen… | — |
Advisories 1
- WID-SEC-2025-1075 Dell Computer (Qualcomm Adreno GPU Display Driver): Schwachstelle ermöglicht nicht spezifizierten Angriff BSI CERT-Bund (WID) · May 15, 2025